Cart
0
0
item(s)
-
$0.00
No products
To be determined
Shipping
$0.00
Total
Quantity
Total
Product successfully added to your shopping cart
There are 0 items in your cart.
There are 0 items in your cart.
Total
IEC 60749-3 Ed. 2.0 b:2017
IEC 60749-3 Ed. 2.0 b:2017 Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
standard by International Electrotechnical Commission, 03/03/2017
Reduced price!
M00015330
New product
Full Description
IEC 60749-3:2017 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance.This edition includes the following significant technical changes with respect to the previous edition:
a) reference to the need for ESD protection;
b) inclusion of information on the phenomenon of tin whiskers;
c) inclusion of an optional report form/checklist.
