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IEC 60749-24 Ed. 1.0 b:2005

IEC 60749-24 Ed. 1.0 b:2005

IEC 60749-24 Ed. 1.0 b:2005 Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

standard by International Electrotechnical Commission, 11/21/2005

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The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

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Edition: 1.0 Published: 11/21/2005 Number of Pages: 19 File Size: 1 file , 470 KB

 
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