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ASTM F996-98(2003)

ASTM F996-98(2003)

ASTM F996-98(2003) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

standard by ASTM International, 01/01/2003

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Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics

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Published: 01/01/2003 Number of Pages: 7 File Size: 1 file , 89 KB

 
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